By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations when it comes to checking out and diagnostics. thoughts are fairly liable to defects considering that they make the most the know-how limits to get the top density. This e-book is a useful advisor to the checking out and diagnostics of the newest iteration of SRAM, essentially the most largely utilized kinds of reminiscence. Classical equipment for checking out reminiscence are designed to address the so-called "static faults," yet those attempt strategies usually are not enough for faults which are rising within the newest Very Deep Sub-Micron (VDSM) applied sciences. those new fault types, often called "dynamic faults", should not lined through classical try out recommendations and require the devoted try out sequences offered during this book.
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Extra resources for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel